This Feature Article by McNeill and Ade reviews the characterisation of the structural composition and morphology of thin film organic semiconductors using different X-ray techniques. The authors discuss six different applications of soft X-rays including scanning transmission X-ray microscopy (STXM); resonant X-ray scattering; resonant X-ray reflectivity; near-edge X-ray absorption fine-structure spectroscopy; polarized STXM and polarized soft X-ray scattering. The authors conclude that soft X-ray techniques have great potential for unravelling the complex structures shown by organic semiconductor blends and multilayers.
Soft X-ray characterisation of organic semiconductor films
J. Mater. Chem. C, 2013, Advance Article. DOI: 10.1039/c2tc00001f (free to read for a short time)
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