This ‘HOT’ paper just published in PCCP results from a large international collaboration across 14 different institutes, and resulted from the 3rd International Summit on Organic Photovoltaic Stability (ISOS-3).
The paper is a systematic TOF-SIMS study of the degradation behavior of six different organic photovoltaic (OPV) devices degraded under three different experimental conditions.
This study highlights the advantage of combining analysis techniques to systematically assess OPV devices. The results of this investigation and previous reports shed new light on OPV stability and is a step towards the large scale application of organic solar cells.
Read the ‘HOT’ PCCP article:
TOF-SIMS investigation of degradation pathways occurring in a variety of organic photovoltaic devices – the ISOS-3 inter-laboratory collaboration
Frederik C. Krebs, Kion Norrman, et al.
Phys. Chem. Chem. Phys., 2012, Advance Article